National Instruments: Have You Considered 
a Modular Source Measure Unit for Your Test System?

May 23, 2016 // By National Instruments
The source measure unit (SMU) is invaluable for test engineers and design engineers alike, whether they are performing an I-V characterization of a metal-oxide semiconductor, field-effect transistor (MOSFET) or analyzing the performance of a high-brightness LED. Since its beginnings in the semiconductor industry decades ago, the SMU has evolved to serve a broader range of applications, becoming a core piece of many automated test systems today.
Measurements