National Instruments: Smart device require smarter test systems

June 27, 2016 // By National Instruments
Smart devices are creating an inflection point in automated test for both the test managers and engineers challenged with ensuring the quality of these devices at increasingly lower costs, and the vendors that serve them. To test their smart devices, organizations are transitioning from the status quo of rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems that scale with escalating requirements to shorten time to market and drive down cost.
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