Customized IC test service from ams extended
June 07, 2012 // Paul Buckley
The Full Service Foundry business unit of ams is extending its dedicated test solutions for its customers.
Foundry customers using ams IC test solution service will receive KGD (known good dies) and instantly gain the benefit of zero yield risk, as their complex analog/mixed-signal ICs are 100% electrically tested according to their own test specification. The electrical test can be performed at the wafer level (i.e. wafer probing), on assembled parts (also including advanced packages such as wafer level chip scale packages, or WLCSP) or at both levels.
The offering starts with an in-depth design for testability (DFT) analysis carried out jointly with highly experienced design support engineers from ams. Test program code development can be accomplished very quickly using ams production-proven test code library and offline tester simulator debugging. An independent and dedicated professional test team with a combined 25+ years of experience offers remote debug sessions to shorten debug and development cycle time. As an integral part of its EEPROM IP portfolio ams also offers a programming service, so the customer has no need to program its EEPROM block after delivery of the die. This may significantly reduce the programming efforts for the end customer.All news
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