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GuideWare methodology extended to support both speed and accuracy for linting
June 05, 2012 // Julien Happich
Atrenta has just launched the Fast Lint methodology for its SpyGlass RTL analysis and optimization platform.
The new capability is part of Atrenta's GuideWare reference methodology, and tests on a wide range of designs have shown a 4X to 9X speed improvement while still delivering accurate, low noise results.
In addition to Fast Lint, the company has demonstrated hierarchical analysis support, which abstracts design elements that have been pre-analyzed for higher (chip-level) analysis. This approach can deliver 5X to over an order-of-magnitude speed improvement for highly complex designs as compared to running flat (i.e., without hierarchy), claims the company.
The SpyGlass linting solution analyzes a design at the register transfer level (RTL) of abstraction for coding styles and circuit constructs that can cause verification and implementation issues. Linting forms the base capability for the SpyGlass platform, which is also used widely for power optimization, clock synchronization verification (CDC), testability, constraints management and routing congestion analysis. Design groups use SpyGlass to verify that their design is ready to be handed off to back-end physical implementation tools. The Fast Lint methodology allows rapid feedback during the early stages of RTL development. It is also used by revision control systems before new code check-in occurs.
“Last year, we introduced Advanced Lint at DAC to provide a highly detailed and accurate linting analysis,” said Mike Gianfagna, vice president of marketing at Atrenta. “Our customers told us they also wanted a fast capability during early RTL development. We listened, and this year we are introducing Fast Lint to provide our customers with both speed and accuracy.”
Visit Atrenta at www.atrenta.com
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