Exploiting depth sensing for 3D interfaces and complex image analysis 
Floating surge stopper provides unlimited overvoltage protection
Altera to integrate Enpirion power interfaces into its FPGAs
Automation CAN group plans permanent interoperability test capability
Opening up new user-interaction scenarios with Time-of-Flight measurements 
Goepel electronic initiates Cooperation Network with EMS companies
The number of charging stations for electrical vehicles is expected to soar by 20220, study says 
In automotive lighting, LEDs still lacks of horsepower, study says
Ultra-low-power SoC supports world's smallest Bluetooth location stickers 
Imec and Renesas collaborate on ultra-low power short range radios
European Semiconductor Distribution Market shows sequential recovery in Q1/CY13
Omron appoints TME to strengthen presence in Eastern Europe
Avnet Supply Chain Solutions launches RaBET Tool in Europe
sureCore receives £250K SMART Award to prototype its low power SRAM technology
Amantys partners Fuji Electric to launch IGBT gate drivers for wind and solar markets
GuideWare methodology extended to support both speed and accuracy for linting
June 05, 2012 // Julien Happich
Atrenta has just launched the Fast Lint methodology for its SpyGlass RTL analysis and optimization platform.
The new capability is part of Atrenta's GuideWare reference methodology, and tests on a wide range of designs have shown a 4X to 9X speed improvement while still delivering accurate, low noise results.
In addition to Fast Lint, the company has demonstrated hierarchical analysis support, which abstracts design elements that have been pre-analyzed for higher (chip-level) analysis. This approach can deliver 5X to over an order-of-magnitude speed improvement for highly complex designs as compared to running flat (i.e., without hierarchy), claims the company.
The SpyGlass linting solution analyzes a design at the register transfer level (RTL) of abstraction for coding styles and circuit constructs that can cause verification and implementation issues. Linting forms the base capability for the SpyGlass platform, which is also used widely for power optimization, clock synchronization verification (CDC), testability, constraints management and routing congestion analysis. Design groups use SpyGlass to verify that their design is ready to be handed off to back-end physical implementation tools. The Fast Lint methodology allows rapid feedback during the early stages of RTL development. It is also used by revision control systems before new code check-in occurs.
“Last year, we introduced Advanced Lint at DAC to provide a highly detailed and accurate linting analysis,” said Mike Gianfagna, vice president of marketing at Atrenta. “Our customers told us they also wanted a fast capability during early RTL development. We listened, and this year we are introducing Fast Lint to provide our customers with both speed and accuracy.”
Visit Atrenta at www.atrenta.com
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Feature Articles
Exploiting depth sensing for 3D interfaces and complex image analysis
May 20, 2013
Nowadays intelligent sensor networks have entered many application fields ranging from building and industrial automation ...
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Technology News
Floating surge stopper provides unlimited overvoltage protection
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Technology News
Altera to integrate Enpirion power interfaces into its FPGAs
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Automation CAN group plans permanent interoperability test capability
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Feature Articles
Opening up new user-interaction scenarios with Time-of-Flight measurements
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Goepel electronic initiates Cooperation Network with EMS companies
May 17, 2013
Goepel electronic has initiated a comprehensive cooperation network with contract manufacturers, the “EMS Partner Program”, ...
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The number of charging stations for electrical vehicles is expected to soar by 20220, study says
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Market News
In automotive lighting, LEDs still lacks of horsepower, study says
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Ultra-low-power SoC supports world's smallest Bluetooth location stickers
Technical papers
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