Keithley updates its semiconductor parametric test software
September 29, 2010 // Julien Happich
Keithley Instruments announced a new release of its ACS Basic Edition semiconductor parametric test software for semiconductor test and measurement applications. ACS Basic Edition Version 1.2 adds new levels of usability, convenience, and productivity in the characterization of component or discrete (packaged) semiconductor devices.
ACS Basic Edition offers a rich set of quick and easy-to-access test libraries, so no programming is needed. An intuitive GUI further simplifies many types of I-V testing, data collection, and analysis. Even novice users can test a semiconductor component in seconds, generate a family of curves, and then compare them with reference curves immediately. While pre-configured tests minimize startup time, the user still has the flexibility to optimize a test or the entire test system.
The new Trace Mode feature of ACS Basic Edition Version 1.2 supports interactive testing of a device. It can be used to map out the operating range and characteristics of a DUT while avoiding damage to the device. This interactive mode includes a convenient method of controlling the voltage level of a sweep with either a virtual slide bar or the arrow keys on a PC keyboard.
ACS Basic Edition maximizes productivity for technicians and engineers responsible for packaged part characterization in applications ranging from early device research through development, quality verification, and failure analysis. It will serve university researchers and developers of novel devices equally well, aiding in the transition from pure research to commercial application. It can also be used in semiconductor facilities and companies involved in pilot production for process refinement at the component level, supporting engineers involved in QA, failure analysis, and post-production testing.
For more information about ACS Basic Edition Version 1.2, visit www.keithley.com/products/semiconductor/characterizationsoftware/acsbasic/?mn=ACSBasicEditionVisit Keithley Instruments at www.keithley.com All news
Audi, BMW, Daimler drive open source measurement data management
July 28, 2014
To enable a correct interpretation and comparison of test data across the automotive industry, a number of carmakers and ...
A roadmap for cool and lossless lasers, with Bismuth
ST opens MEMS microphone test laboratory
Update yourself on anti-counterfeiting measures at Mouser
60 GHz startup targets mobile
Dual 13A or single 26A μModule regulator integrates digital power system management
July 25, 2014
Datacenters and server farms contain vast amounts of digital electronics, such as ASICs, FPGAs and CPUs. Powering, monitoring ...
What's that smell? An app for that soon, says Sensirion
GE phosphor powder creates more vibrant LED displays
Sensor manufacturer extends software capabilities
- THE RTOS AS THE ENGINE POWERING THE INTERNET OF THINGS
- Testing GPS with a Simulator
- DSM presents: Select the best plastic for DDR4
- Dual 13A μModule Regulator with Digital Interface for Remote Monitoring & Control of Power
InterviewCEO interview: China, not Apple, is way to go, says mCube CEO
Ben Lee, CEO of MEMS startup mCube, explains why he wants to spend $37 million on being a supplier of sensors to Chinese ODMs and avoiding a design win with Apple or Samsung.
Filter WizardCheck out the Filter Wizard Series of articles by Filter Guru Kendall Castor-Perry which provide invaluable practical Analog Design guidelines.
Linear video channel
READER OFFERRead more
This month, Altium Ltd is offering EETimes Europe's readers the chance to win one TASKING VX-Toolset for ARM Cortex-M Premium Edition, normally licensed for 2.395 Euros, for ultra-rapid prototyping and code development around ARM Cortex-M based microcontrollers.
The VX-toolset for ARM is the first TASKING compiler suite to receive the Software Platform technology, which is seamlessly...Read more
December 15, 2011 | Texas instruments | 222901974
Unique Ser/Des technology supports encrypted video and audio content with full duplex bi-directional control channel over a single wire interface.