Keithley updates its semiconductor parametric test software
September 29, 2010 // Julien Happich
Keithley Instruments announced a new release of its ACS Basic Edition semiconductor parametric test software for semiconductor test and measurement applications. ACS Basic Edition Version 1.2 adds new levels of usability, convenience, and productivity in the characterization of component or discrete (packaged) semiconductor devices.
ACS Basic Edition offers a rich set of quick and easy-to-access test libraries, so no programming is needed. An intuitive GUI further simplifies many types of I-V testing, data collection, and analysis. Even novice users can test a semiconductor component in seconds, generate a family of curves, and then compare them with reference curves immediately. While pre-configured tests minimize startup time, the user still has the flexibility to optimize a test or the entire test system.
The new Trace Mode feature of ACS Basic Edition Version 1.2 supports interactive testing of a device. It can be used to map out the operating range and characteristics of a DUT while avoiding damage to the device. This interactive mode includes a convenient method of controlling the voltage level of a sweep with either a virtual slide bar or the arrow keys on a PC keyboard.
ACS Basic Edition maximizes productivity for technicians and engineers responsible for packaged part characterization in applications ranging from early device research through development, quality verification, and failure analysis. It will serve university researchers and developers of novel devices equally well, aiding in the transition from pure research to commercial application. It can also be used in semiconductor facilities and companies involved in pilot production for process refinement at the component level, supporting engineers involved in QA, failure analysis, and post-production testing.
For more information about ACS Basic Edition Version 1.2, visit www.keithley.com/products/semiconductor/characterizationsoftware/acsbasic/?mn=ACSBasicEditionVisit Keithley Instruments at www.keithley.com All news
Real-time data hub for smart electromobility
August 27, 2015
Intelligent mobility is requires that cars can share data – for example with other vehicles, with services providers, repair ...
Apple iCar: Do iCare?
Qorvo takes strategic stake in MEMS vendor Cavendish
Here strives to establish uniform auto sensor data format
Panasonic to close Beijing battery factory, sheds 1,300 jobs
TSMC pulls plug on solar business
August 27, 2015
TSMC's six-year flirtation with solar and LED manufacturing as diversifying alternatives to IC foundry work is coming to ...
Will profits move from LED packages towards LED drivers?
Racing car technology reaches road freight vehicles
Another fusion reactor breakthrough
- Software-Defined Radio Handbook
- Why Making the Move from a Variable Transformer to a VariPLUS is the Right Decision
- Automating Leakage and Functional Testing
- Automotive Circuit Protection using Littelfuse Automotive TVS Diodes
InterviewCEO interview: Ambiq sees broader options for low voltage
Mike Noonen, recently appointed interim CEO at microcontroller startup Ambiq Micro, discusses the focus and opportunities for this pioneering company designing circuits that can operate below the threshold ...
Filter WizardCheck out the Filter Wizard Series of articles by Filter Guru Kendall Castor-Perry which provide invaluable practical Analog Design guidelines.
Linear video channel
READER OFFERRead more
This month, Novelda is giving away two full XeThru Inspiration kits worth 1499 US Dollars each, for EETimes Europe's readers to experiment first hand with its XeThru technology.Based on the use of radio waves, rather than infrared, ultrasound or light, the company's X2M1000 Inspiration modules can detect presence just from the chest movement while breathing, and measure both the rate and... MORE INFO AND LAST MONTH' WINNERS...
December 15, 2011 | Texas instruments | 222901974
Unique Ser/Des technology supports encrypted video and audio content with full duplex bi-directional control channel over a single wire interface.