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Nujira aims to push the envelope with advanced software tool for PA characterization and visualization

June 15, 2012 // Paul Buckley

Nujira aims to push the envelope with advanced software tool for PA characterization and visualization

Nujira Ltd has released an advanced measurement and data visualization tool for characterizing RF power amplifiers (PAs) in ET mode.

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ET Surface Explorer is a software upgrade to Nujiras existing NCT-T9102 RF PA characterization system. It accelerates PA characterization, provides PA and product designers greater insight into the performance of ET PAs, and enables them to maximize the linearity, efficiency and output power benefits of operating PAs in ET mode.

ET Surface Explorers advanced workflow provides a massive productivity boost, replacing thousands of complex, repetitive and time-consuming lab measurements with a single measurement pass, which typically takes less than two minutes to capture and process.

ET Surface Explorer lets designers visualize how PAs behave under live ET supply modulation conditions, unlocking the optimum performance and efficiency characteristics of a given PA. Postprocessing and offline analysis tools create 3D surfaces of gain, phase and efficiency, to give designers far greater insight into ET PA performance. The tool can also automatically generate, model and export a wide variety of shaping tables, including ISOGAIN or Maximum Efficiency.

ET Surface Explorers offline analysis and modeling tools allow the designer to rapidly predict and compare application performance from the comfort of their desk, without requiring multiple test iterations in the lab. The user simply loads an input waveform from disk, specifies the RF power level and selects a shaping table or DC supply voltage. ET Surface Explorer then uses the captured PA surface model to accurately predict adjacent channel leakage ratio (ACLR), efficiency, AM/AM and AM/PM distortion, power dissipation and other parameters in a matter of seconds. Selected scenarios can then be re-verified in hardware, and compared against the predictions of the model.
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