MEMS accelerometers spot structural defects

October 04, 2016 // By Peter Clarke
Generic MEMS accelerometer
Analog Devices Inc. (Norwood, Mass.) has announced the introduction of two three-axis accelerometers suitable for vibration measurement and the detection of structural defects via wireless sensor networks.

The ADXL354 and ADXL355 accelerometers have outputs of ±2g to ±8g full scale range (FSR) with selectable digital filtering from 1Hz to 1kHz at less than 200-microamps current consumption.

The low power consumption and low noise make the devices suitable for low-level vibration measurement applications such as structural health monitoring, ADI claims.

Both devices are packaged in a 6mm by 6mm, 14-lead LCC. The ADXL354 is priced at $25.42 each in 1,000 unit quantities. The ADXL355 is priced at $28.25 in the same quantities.

Datasheets, samples and evaluation boards are available.

www.analog.com