Wafer-scale CMOS X-ray imaging for medical applications

July 19, 2012 // By Paul Double and Dr. Renato Turchetta
There is an increasing interest in the use of solid-state based X-ray medical imaging and detection systems in the replacement of conventional diagnostic imaging techniques.

One of these technologies is wafer-scale CMOS-sensor based imaging, which can bring key advantages in terms of performance such as high resolution, high dynamic range and low noise capabilities. Additionally, it can offer significant system cost advantages for X-ray imaging applications, although it can come with an initial penalty in terms of design complexity in the development of the CMOS sensor.

Read the full article on page 28 of our July/August digital edition.